FLIR Systems’ new equipment for NDT and stress mapping of advanced materials

September 6, 2018

 

FLIR Systems' new equipment for NDT and stress mapping of advanced materials

FLIR’s A6750sc SLS thermal imaging camera for NDT and stress mapping (Courtesy FLIR Systems)

FLIR Systems, headquartered in Wilsonville, Oregon, USA, has launched its FLIR A6750sc SLS thermal imaging camera range for the Non-Destructive Testing (NDT) of advanced materials. The new camera range features lock-in, transient, and pulse capabilities for NDT, as well as for stress mapping during materials testing.

NDT is widely used to evaluate the properties of a material, component, or system without causing damage. Thermal imaging cameras can detect internal defects through target excitation and the observation of thermal differences on a target’s surface, and can be used for the detection of defects and points of failure in composites, solar cells, bridges and electronics.

The FLIR A6750sc SLS incorporates a cooled Strained Layer Superlattice detector that is said to operate in the 7.5–10.5 µm waveband and produce 640 x 512 px thermal imagery. It is capable of detecting temperature differences smaller than 20 mK (typically 18 mK). Th company’s proprietary ‘lock-in’ process is said to make it possible to detect temperature differences as small as 1 mK.

The FLIR A6750sc SLS uses a standard GigE Vision® interface to transmit full dynamic range digital video and GenICam for camera control. Additional interfaces include a BNC analog video output. The camera is designed to work seamlessly with FLIR’s ResearchIR Max software to enables intuitive viewing, recording and advanced processing of the thermal data provided. A Software Developers Kit is also optionally available.

www.flir.eu/instruments/science/ndt-materials-testing/

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